Ramptime propagation on designs with cycles

ABSTRACT

A method and apparatus for calculating ramptime propagation for integrated circuit layout patterns having pins interconnected in an oriented graph in one or more closed loops is described. Ramptime values are calculated for a first set of the pins, which are not connected to a closed loop while leaving a second set of the pins with unknown ramptime values. One or more closed loops are identified by backtracking from the pins in the second set with unknown ramptime values. A ramptime value for each pin in the one or more closed loops is calculated iteratively.

CROSS-REFERENCE TO RELATED APPLICATION

The present application is a divisional of and claims priority from U.S.patent application Ser. No. 11/004,309, filed Dec. 3, 2004, the contentof which is hereby incorporated by reference in its entirety.

FIELD OF THE INVENTION

The present invention relates to processes and systems for designingintegrated circuits (ICs), sometimes referred to as “chips”. Moreparticularly, the present invention relates to a system and method forestimating ramptime propagation of signals within integrated circuitdesigns.

BACKGROUND OF THE INVENTION

Semiconductor integrated circuits are traditionally designed andfabricated by first preparing a schematic diagram or hardwaredescription language (HDL) specification of a logical circuit in whichfunctional elements are interconnected to perform a particular logicfunction. With standard cell technology, the schematic diagram of HDLspecification is synthesized into standard cells of a specific celllibrary.

Each cell corresponds to a logical function unit or block, which isimplemented by one or more transistors that are optimized for the cell.The logic designer selects particular cells according to a number ofloads attached to the cell and to an estimated interconnection requiredfor routing. The cells in the cell library are defined by cell librarydefinitions. Each cell library definition includes cell layoutdefinitions and cell characteristics. The cell layout definitionincludes a layout pattern of the transistors in the cell, geometry datafor the cell's transistors and cell routing data. The cellcharacteristics include a cell propagation delay, a model of the cell'sfunction, input capacitance, output capacitance and output ramptime as afunction of load. The propagation delay is a function of the internaldelay and the output loading (or “fan-out”) of the cell.

A series of computer aided design tools generate a netlist from theschematic diagram or HDL specification of the selected cells and theinterconnections between the cells. The netlist is used by a floorplanner or placement tool to place the selected cells at particularlocations in an integrated circuit layout pattern. The interconnectionsbetween the cells are then routed along predetermined routing layers.The design tools then determine the output loading of each cell as afunction of the number of loads attached to each cell, the placement ofeach cell, and the routed interconnections.

A timing analysis tool is then used to identify timing violations withinthe circuit layout. The time it takes for a signal to travel along aparticular path or “net” from one sequential element to another dependson the number of cells in the path, the internal cell delay, the numberof loads attached to the cells in the path, the length of the routedinterconnections in the path, and the drive strengths of the transistorsin the path.

A timing violation may be caused by a number of factors. For example, aparticular cell may not have a large enough drive strength to drive thenumber of loads that are attached to that cell. Also, exceptionally longrouting paths may cause timing violations. Timing violations can beeliminated by making adjustments at each stage in the layout process.For example, the logic diagram or HDL specification can be changed torestructure or resynthesize certain sections of logic to improve timingthrough that section.

Additionally, other changes and adjustments may be made in the layout toimprove timing considerations and/or to meet design specifications.

Once the timing violations and timing considerations have beencorrected, the timing analysis tool is again utilized to identify anyfurther timing violations within the circuit layout. The processes oftiming analysis and layout adjustment may be repeated iteratively untilall timing violations have been eliminated. Once the layout timing hasbeen resolved, the netlist, the cell layout definitions, the placementdata, and the routing data together form an integrated circuit layoutdefinition, which can be utilized to fabricate an integrated circuit.

The complexity of state of the art integrated circuits may cause suchiterative procedures as described above to be repeated many times inorder to achieve an IC design that meets the design criteria. Onetechnique for achieving timing recomputation is described in U.S. Pat.No. 6,553,551 and is incorporated herein by reference in its entirety.

One issue that arises in timing recomputation and resynthesis involvesinterconnections between pins that form a closed loop or “cycle” withina layout pattern. Computing ramptime propagation within a layout patternthat includes a cycle requires determining ramptime calculations foreach pin in the cycle, which is partially determined by timing fromevery other pin in the cycle.

If there are no cycles in the IC design, ramptime propagationcalculations can be performed without any problem on a level-by-levelbasis. However, to utilize a conventional iterative procedure forresolving ramptime propagation issues in layout patterns with cycles,multiple calculations and iterations are required for each of the manypins of the design.

There is a need in the art for a process and method for estimatingramptime propagation in layout designs with cycles. Embodiments of thepresent invention provide solutions to these and other problems, andoffer advantages over the prior art.

SUMMARY OF THE INVENTION

A method for calculating ramptime propagation for integrated circuitlayout patterns having pins interconnected in an oriented graph in oneor more closed loops is described. Ramptime values are calculated for afirst set of the pins, which are not connected to a closed loop whileleaving a second set of the pins with unknown ramptime values. One ormore closed loops are identified by backtracking from the pins in thesecond set with unknown ramptime values. A ramptime value for each pinin the one or more closed loops is calculated iteratively.

In one embodiment, a ramptime evaluation tool is adapted to calculateramptime values for pins in an oriented graph based on an integratedcircuit layout design. The ramptime evaluation tool is adapted tolocalize cycled parts of the design and to calculate iteratively onlythose ramptime values associated with pins in the cycled parts of thedesign.

In another embodiment, a method for calculating ramptime propagation onan integrated circuit layout is described. An oriented graph of pins inthe design is constructed. Ramptime values are calculated for a firstset of pins in the layout using a pin level assignment algorithm. Someof the pins of the first set of pins in the layout have predefinedramptimes. A cycled portion of the layout is localized. The cycledportion corresponds to a second set of pins of the layout that areinterconnected to form a closed loop. Ramptime values for each pin inthe second set are calculated iteratively.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a simplified node diagram of a process for level assignmentaccording to an embodiment of the present invention.

FIG. 2 is a simplified flow diagram for localized calculation oframptime propagation in designs with cycles according to an embodimentof the present invention.

FIG. 3 is a simplified diagram of a cycled graph according to anembodiment of the present invention.

FIGS. 4 and 5 are diagrams of cycled graphs according to otherembodiments of the present invention.

FIG. 6 is a simplified diagram of two cycled graphs according to anembodiment of the present invention.

FIGS. 7, 8 and 9 illustrate a back tracing process of three cycledgraphs according to embodiments of the present invention.

FIG. 10 is a simplified flow diagram of a process for assigning pins ofa cell to a particular level.

FIG. 11 is a simplified flow diagram of a process for localized ramptimecalculation according to an embodiment of the present invention.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

The following disclosure is directed to an algorithm for calculatingramptime propagation on circuit layout designs with cycles, whichlocalizes ramptime calculations for cycled parts of the layout designand uses an iterative procedure to calculate the ramptime propagationonly for the cycled parts, for example. By limiting the iterativecalculation procedure to small subparts of the larger design layout, aramptime propagation calculation for the entire circuit layout is moreefficient.

In general, each technology includes a specification that sets a maximumallowable ramptime that can occur at an input pin without causing aramptime violation. Ramptime violations are reduced by generating acapacitance constraint for each net driver type in the technologylibrary and by providing the capacitance constraints to the re-synthesisalgorithm. The capacitance constraints estimate for each net in thenetlist a total interconnect capacitance, including wire capacitance andpin capacitance that would result in the maximum allowable ramptime atthe input pins coupled to that net. The capacitance constraints are usedby the re-synthesis algorithm to ensure that each net has a capacitancethat is smaller than the capacitance constraint of the net driver. Withthese constraints, it is guaranteed that the degraded ramptimes at eachinput pin are smaller than the maximum allowable ramptime value.

An embodiment of the present invention provides a method and apparatusfor calculating ramptime propagation, which can be used, for example, toanalyze timing after design optimization, such as that described in U.S.Pat. Nos. 6,546,361 and 6,470,487, which are incorporated herein byreference in their entirety. Additionally, the method and apparatus canbe implemented as part of a design timing computation, such as thatdescribed in U.S. Pat. No. 6,553,551 which is incorporated herein byreference in its entirety.

The method and apparatus can be implemented as a stand-alone testingsystem for use with a computer or other processing system, or can beimplemented as part of a larger internal re-synthesis tool. Moreover,the method and apparatus can be adapted to utilize standard delaylibraries for high precision timing computation.

During cell delay calculation, an embodiment of the present inventiondetermines all cell edge delays. An edge delay refers to the timenecessary for a transition or “edge” of a signal to propagate from aninput pin of a cell to the corresponding output pin of the cell. Thedelay of a cell edge is a sum of two components: an intrinsic delay ofthe cell and a transition delay of the cell. Each of these twocomponents depends on cell type, on the capacitance of the net connectedto the output pin, and on the ramptime of the input pin.

Generally, the capacitances of nets are local characteristics. Tocalculate a net capacitance of a given net, the system receives a listof pins of cells connected to a given net, as well as the topology ofthe corresponding wire.

The net capacitance for each net in a layout can be calculatedindependently of each other.

By contrast, the calculation of a ramptime on pins is more complicated.The ramptime on a given output pin is equal to the maximum of thetransition delay values for all input signals ending on the output pin.Thus, the ramptime on an output pin depends on the ramptimes on inputpins of the cell that are connected by edges with the output pin.

By contrast, the ramptime on an input pin connected to a net is equal tothe sum of the ramptime on the net driver, and of the locally calculatedramptime degradation. Additionally, a default ramptime value can beassigned to all unconnected input pins and to input pins connected tothe power or to the ground of the design. It is assumed that ramptimesare provided for all inputs of the design.

A. Oriented Graph

In general, FIG. 1 represents an oriented graph 100 according to anembodiment of the present invention. All cell pins 102 of the graph areconsidered vertices of the graph 100. Cell pins 102 connected byoriented edges 108, explained in more detail below. Within the figure,each cell pin 102 is differentiated by a letter (A-I), and thecorresponding oriented edge 108 is indicated by the cell pin letterswith the letters ordered according to the edge orientation. For example,an oriented edge 108 connecting pin 102A to pin 102B is identified asedge 108AB.

The term “oriented edge” refers to a direction of signal flow betweencell pins, such as from an input pin of a cell to an output pin of thesame cell, or from an output pin of one cell to an input pin of anothercell. A pair of cell pins 102 (A,B) is connected by an oriented edge 108if one of the following conditions is valid:

-   -   1. Cell pin “A” is an input pin of a cell, cell pin “B” is an        output pin of the same cell, and there is a cell edge connecting        pins A and B (i.e. the logic state on output pin B is determined        at least in part by the logic state or edge transition on input        pin A, such that the ramptime on pin B is a function of the        ramptime on pin A); and    -   2. Cell pin A is an output pin of a cell, cell pin B is an input        pin of a different cell, and pins A and B are connected by a        wire.

In other words, a cell pin pair (A,B) has an oriented edge 108 if andonly if the ramptime for the pin A must be known for the pin B ramptimecalculation.

In the example shown in FIG. 1, a pair of pins (for example, 102A and102B) has an oriented edge 108AB if one of the following conditions isvalid:

-   -   1. Cell pin 102A is an input pin of a cell, cell pin 102B is an        output pin of the same cell, and there is a cell edge connecting        pins 102A and 102B; or    -   2. Cell pin 102A is an output pin of a cell, cell pin 102B is an        input pin of a different cell, and cell pins 102A and 102B are        connected by a wire 108AB.

Ramptimes of cell pins 102 within the graph 100 are assumed to be givenor provided if the pin 102 has no edge 108 ending on it.

In the graph 100, pins 102A and 102D are at Level 0 and have no edgesending on them; therefore, the ramptimes for the input pins 102A and102D are assumed to be given or known. These pins are level zero cellpins and can be considered as inputs to the oriented graph underconsideration for ramptime calculation.

Pins 102B and 102G have at least one edge ending on them and are atLevel one, since they are driven by at most one level of oriented edges,as measured from the inputs (pins 102A and 102D) of the oriented graph.A level two pin (such as pin 102C) is driven by one or more level 1 pins(such as pin 102B), but no higher level cell pins 102. A level two pinis therefore driven by two levels of oriented edges (such as 108AB and108BC), as measured from the inputs to the oriented graph.

A level three pin (such as 102E) is coupled to one or more level twopins (such as pin 102C). A level four pin (such as cell pins 102F and102H) are driven by one or more level three pins (in this case, pin102E). Finally, a level five pin (such as cell pin 1021) is driven byone or more level 4 pins (such as cell pin 102H). Any number of cellpins 102 or levels are allowed. It is important to note that a pin 102is assigned to a next level higher than its highest input from anoriented edge 108. For example, though pin 102H has inputs from levelthree pin 102E and a level 1 pin 102G over edges 108EH and 102GH,respectively, pin 102H is assigned to level four (one level higher thanits highest level input 102E). In other words, pin 102H must be a levelfour pin because it accepts an input signal from a level three pin 102E.

In this particular example, the constructed oriented graph 100 does notcontain any cycles, or closed loops. A cycle is a closed loop whereinthe ramptime of each pin 102 of the cycle depends in part on theramptime of every other pin 102 in the cycle. Consequently, the ramptimecalculations can be made using a relatively simple the “level assignmentalgorithm” without concern for excessive iterations. It is assumed bythe level assignment algorithm that some pins in the graph (level zeropins, such as cell pins 102A and 102D) have ramptime values that areknown (given or assigned). For the designs without cycles, these are thepins without oriented edges ending on those pins. The ramptime values onthese pins are either specified by users, or are the default ramptimevalues, for example. All such pins are set to level zero.

B. Level Assignment Algorithm

FIG. 2 is a flow chart, which illustrates an example of a levelassignment algorithm that can be used to calculate the ramptimes of cellpins for the oriented graph shown in FIG. 1.

The general process for calculating ramptimes is provided in pseudo-codefor a given level L, where L is within a range of 1 to a maximum level(step 200), the procedure is repeated until all levels are calculated.For each pin (B_(I)), from I=1 to N pins, where the ramptime of pinB_(I) is unknown (step 202), the algorithm checks to see if for alloriented edges (A, B_(I)), the ramptimes on pins A are known (step 204).If not, the algorithm checks to see if B_(I) is the last possible pin(is I=N pins) (step 206). If not, the algorithm increments the pin tothe next pin in the list (I=I+1) (step 208), and repeats step 104. IfB_(I) is the last pin (I=N pins) (step 206), then the algorithmcalculates ramptimes of all pins assigned to the level (L) (step 212).If the ramptime on pin A is known for the oriented edge (A,B_(I)) thenthe algorithm assigns pin B_(I) to level L (step 210), the algorithmthen checks to see if B_(I) is the last pin (I=N pins) (step 206). Ifnot, the algorithm increments the pin (step 208) and repeats the testfor the ramptime on pin A for the oriented edge (step 204).

Again, if B_(I) is the last pin (step 206), the algorithm calculates theramptimes of all pins assigned to the level (L) (step 212). Thealgorithm then checks to see if L is the max level (step 214). If it isnot, the algorithm increments the level (step 216) and repeats step 202and sequence. If the level is the max level (step 214), then allramptime calculations are complete (step 218).

C. Cycled Parts of a Design

In the case of a constructed oriented graph where the graph contains atleast one cycle, the algorithm of FIG. 2 and the associated orientedgraph of FIG. 1 are inapplicable because the ramptime on any pin 102 inthe cycle depends on all other ramptimes of the cycle. Conventionally,an iterative procedure is used for ramptime calculations involvingcycles. For example, at the beginning of the calculation, the ramptimesof all pins in the cycle are set to some default ramptime value. Then,the iterative ramptime calculation is started.

The ramptimes on pins are calculated based on the current values of theramptimes. Then, each of the pins is updated by assigning the newlycalculated ramptime value. The ramptimes are then recalculatediteratively until the ramptime value for each input pin in the cyclechanges by less than a predetermined amount (e.g. become almost stable).In other words, the iteratively calculated ramptime reaches a value thatis very close to the corresponding value calculated during the previousiterative procedure.

Unfortunately, the iterative approach requires more and more iterationsto achieve greater levels of accuracy. Moreover, the procedurescalculating the transition delays and the ramptime degradations areusually very slow (if accuracy is required). Calculating ramptimesiteratively, it is necessary to call the ramptime calculation algorithmmany times for each pin.

One embodiment of the present invention makes use of the observationthat the cycled portions of oriented graphs are usually very small.Consequently, the ramptime calculation algorithm of this embodimentperforms iterative calculations only on the small cycled portions, andcalculates the ramptimes of other non-cycled pins using the levelassignment algorithm described above. In this way, the ramptimecalculation algorithm is able to avoid multiple ramptime calculations onlarge numbers of pins, so the algorithm introduces significant savingsin both time and processing overhead. After the cycled part localizationis made, the iterative ramptime calculation can be applied only to thecycled part, and then the ramptime calculation can be continued usingthe level assignment procedure, thereby simplifying and acceleratingoverall the ramptime calculation process.

In general, a graph is a cycled graph if for each vertice A,B of thegraph, there is a path connecting the vertices. In other words, thegraph is a cycled graph if there is a sequence of the oriented graphedges that forms a closed loop or circle. The simplest example of thecycled graph is a cycle or circle such as that shown in FIG. 3.

FIG. 3 illustrates a simplest form of a cycled graph 300 according to anembodiment of the present invention. The cycled graph 300 includes aplurality of pins 302A-302F wherein each pin of the graph 300 is coupledto another pin by an oriented edge 308AB-FA in a closed loop (indicatedby phantom loop 310).

FIG. 4 illustrates a more complicated cycled graph 400 according to anembodiment of the present invention. Graph 400 includes pins 402A-402Fand oriented edges 408AB-408FA. In this instance, pins 402B and 402E arecoupled to more than one other pin 402 to form more than one cycle orloop 410.

FIG. 5 illustrates a further complicated cycled graph 500 according toan embodiment of the present invention. Graph 500 includes pins502A-502L with a plurality of oriented edges 508 extending between thepins.

In this instance, pins 502C, 502D, 502G and 502J are coupled to morethan one other pin 502 to form more than one cycle or loop 510.

Cycled subgraphs, such as those shown in FIGS. 4 and 5 have a propertyto be maximal. More precisely, if two cycled subgraphs of an orientedgraph have a common vertex, then the union of these two subgraphs is acycled graph. Thus, the ramptime on a pin in one cycled subgraph candepend on the ramptime of a pin in the other cycled subgraph. Theramptime calculation algorithm of one embodiment of the presentinvention locates maximal cycled subgraphs.

D. Cycle Localization Algorithm

In general, the level assignment algorithm of FIG. 2 can be applied toany design. If the design does not have a cycle, all pin ramptimes arecalculated after the level assignment algorithm finishes. Otherwise, notall pin ramptimes are calculated.

If the design has one or more cycles, we can denote by M the set of allpins (A) such that the ramptime on the pin is not calculated yet. Notethat for each pin BεM (B is contained in set M), there is an orientededge (A,B) of the graph such that AεM (A is contained in set M).

With set M defined, we can start to construct a cycled subgraph tocontinue the ramptime calculation. As mentioned above, the algorithmlooks for the maximal cycled subgraph because the ramptime on each pinof the maximal cycled subgraph depends on all other ramptimes of thecycled subgraph.

A design can include several cycled parts, and the ramptimes of a cycledpart can depend on the ramptimes of another cycled part, as shown in theoriented graph 600 of FIG. 6. Graph 600 includes cycled parts 610A and610B, with a plurality of pins 602A-602M coupled by oriented edges 608.Pin 602C is part of cycled part 610A and has a ramptime that isdependent on all other pins 602D, 602E, and 602F within the cycledportion 610A.

Pin 602F in cycled part 610A is coupled to pin 602H in cycled part 610Bby edge 608FH. Similarly, pin 602D in part 610A is coupled to pin 602Kin part 610B through pin 602G and edges 608DG and 608GK.

In this example, given the orientation of the edges 608FH, 608DG and608GK, the ramptime of pins 602H and 602K in cycled part 610B depend onramptimes of cycled part 610A. Both cycled parts 610A and 610B aremaximal cycled subgraphs. Because the ramptimes of the cycled part 610Bdepend on the ramptimes of the cycled part 610A, the ramptimes of thecycled part 610A have to be calculated earlier.

The maximal subgraph can be identified using the set M defined above sothat the ramptime calculation algorithm can complete. The set M can betraced to locate all pins in a cycled subgraph part of the design. Asmentioned above, there is an oriented edge (A₁,A₀) such that A₁εM. Thecycle localization algorithm back traces the pins in M, beginning withA₁ to identify all pins A₁,A₂, . . . ,A_(K)εM for any K such that thereare edges (A₁,A₀), (A₂,A₁), . . . ,(A_(K),A_(K-1)) of the orientedgraph.

The set M is finite so that the algorithm eventually reaches a pin A_(N)such that A_(N)=A_(n) for some n<N, which defines a closed loop orcycle. There are two possibilities:

-   -   Case 1. There is an oriented edge (b₀,a_(j)), such that b₀εM and        n≦j<N. In other words, the ramptime of this identified cycle        depends on a ramptime of an additional pin b₀, and the        localization of the cycled subgraph should continue until a        maximal subgraph is identified.    -   Case 2. There are no such edges (b₀,a_(j)), so the required        maximal subgraph is found. It contains the vertices        a_(n),a_(n+1), . . . ,a_(N-1).

In case 1, the algorithm back tracks again, beginning with pin b₀.

This back track process identifies a sequence of pins b₀, b₁, . . .,b_(k) of the set M for each pin (0 to k) such that there are orientededges (b₁,b₀),(b₂,b₁), . . . ,(b_(k),b_(k-1)). Sooner or later, thealgorithm identifies a pin b_(L) that has been evaluated before. Threepossibilities of the cycle localization process are shown in FIGS. 7-9.FIG. 7 shows a cycled graph 700 with a plurality of interconnected pins702, and a cycled portion 710. In FIG. 7, the cycle localizationalgorithm begins with pin A₀ and back traces through cell pins A₀, A₁,A_(i), A_(a), A_(j-1), A_(j), A_(N-1), to A_(N), where A_(N)=A_(n).Although a cycle has been found, the algorithm is in case 1, since thereis an oriented edge (B₀,A_(j)) such that B₀εM and n≦j≦N.

The algorithm therefore back tracks again, beginning with B₀, until itlocates pin B_(L) that has been evaluated before. In this example, thecycled subgraph (bounded by dashed lines) has been extended and nowcontains cell pins A_(i), A_(i+1), . . . , A_(N-1), B₀, B₁, . . . ,B_(L-1).

A second possibility is shown in FIG. 8. FIG. 8 illustrates a simplifiedoriented graph 800 according to an embodiment of the present invention.The graph 800 includes a plurality of pins 802, which are interconnectedby oriented edges to form a cycled part 810. As discussed above,beginning with pin 802 (A₀), the algorithm back tracks through pinsA_(i), A_(n), A_(j-1), A_(j), A_(N-1), to A_(N), where A_(N)=A_(B). Thisis another example of case 1 in that pin A_(j) has an oriented edge(B₀,A_(j)) where B₀εM (i.e. B₀ has an unknown ramptime calculation). Thealgorithm begins back tracking at cell pin B₀ until a cell pin B_(L) islocated that has already been evaluated (B_(L)=A_(i)). This cycledsubgraph shown by dashed line 810 has been extended and now containspins A_(n),A_(n+1), . . . ,A_(N-1),B₀B₁, . . . ,B_(L-1), whereB_(L)=A_(i) for some n≦i<N.

Another possibility is shown in FIG. 9. FIG. 9 illustrates a simplifiedoriented graph 900 is shown with an identified cycled subgraph 910.

The graph 900 includes a plurality of pins 902 interconnected byoriented edges in such a way as to produce a cycled subgraph 910.

In this example, the algorithm begins with pin A₀, and locates a firstcycled subgraph including pins A_(n), A_(j-1), A_(j), and A_(n-1). Sincethe ramptime of A_(j) depends on the ramptime of B₀, the algorithmcontinues with B₀ and locates a completely new cycled subgraph with pinsB_(i), B_(i+1), B_(i+2), and B_(L-1), where B_(i)=B_(L) for some I<L.This subgraph should be processed before the initial cycled subgraph.So, the algorithm should continue with the cycled subgraph 910.

From here, the level algorithm shown in FIG. 2 can be continued startingfrom the current cycled subgraph 710, 810, or 910, respectively.

FIG. 10 is a simplified flow diagram of the cycled subgraph localizationalgorithm according to an embodiment of the present invention.

The system initializes the pin level (L) to zero (step 1000). The systemtakes any pin (A) contained in set (M) (step 1002), which is a set ofpins (A) for which the ramptime calculation is not known after the levelassignment algorithm is complete.

Considering a set G (initially consisting of one pin A), the algorithmsets all pins of the set (G) to be of level (L) (step 1004). Thealgorithm then finds a pin (B) contained within the set (M) such thatthe level (L) is not assigned and such that there is an oriented edge(B,A) for some pin A that is contained in the set (G) (step 1006). If nosuch pin is found (step 1008), then set G is the set of all vertices ofthe maximal subgraph (step 1010).

If the pin is found (step 1008), then index K is set to zero and B_(k)is set to pin B (step 1012). The algorithm increments the level (L) andassigns B_(k) to level (L) (step 1014). The algorithm then finds anoriented edge (d,B_(K)), such that pin d is contained within set (M)(step 1016). This edge (d,B_(K)) always exists. If the level of pin d isnot already assigned (step 1018), then index K is incremented and B_(K)is set equal to pin d (step 1020). Steps 1014-1018 are then repeated.

If the level of pin d is already assigned (step 1018), then level L₀ isset to the level of pin d (step 1022). The set G is cleared and allelements of levels equal to or greater than Lo are added to the set G(step 1024). The level L is set to L₀ (step 1026), and steps 1004 andsequence are repeated until the maximal subgraph is identified.

FIG. 11 is a simplified flow diagram of an algorithm for calculatingramptimes for pins of an integrated circuit layout pattern according toan embodiment of the present invention.

First, ramptimes for the non-cycled parts of the layout are calculatedusing the level assignment algorithm (shown in FIG. 2) (step 1100).

The algorithm checks if all ramptimes for the layout have beencalculated (step 1102). If all ramptimes are calculated (step 1102),then the work is finished (step 1104). Otherwise, the algorithm finds acycled subgraph G using the cycled subgraph localization algorithm shownin FIG. 10 (step 1106). The system assigns a default ramptime value toall pins of the subgraph G (step 1108). The ramptime is calculated foreach pin (aεG) of the subgraph G based on the assigned default ramptimes(step 1110). The system then calculates for each pin a differencebetween a previous ramptime value and the newly calculated ramptimevalue (step 1112). The system assigns to D a maximum difference valuefrom the difference calculations of step 1112. If the maximum differenceD is less than D₀ (a specified accuracy of the ramptime calculation fora particular design), then the system returns the calculated ramptimevalue to the level assignment algorithm and proceeds with step 1100. Ifthe maximum difference D is greater than Do, the system recalculates theramptime value for each pin in the subgraph G (step 1110) using thenewly calculated ramptimes for the pins, and repeats steps 1112 through1116 until the ramptimes for all pins in the pin layout have beencalculated.

Although the present invention has been described with reference topreferred embodiments, workers skilled in the art will recognize thatchanges may be made in form and detail without departing from the spiritand scope of the invention.

1. A ramptime evaluation tool adapted to calculate ramptime values forpins in an oriented graph based on an integrated circuit layout design,the ramptime evaluation tool adapted to localize cycled parts of thedesign and to calculate iteratively only those ramptime valuesassociated with pins in the cycled parts of the design.
 2. The ramptimeevaluation tool of claim 1 wherein the ramptime evaluation toolcalculates ramptimes for all pins not associated with pins in the cycledparts of the design using a level assignment algorithm adapted tocalculate a ramptime based on predefined ramptimes of other pins in thedesign.
 3. The ramptime evaluation tool of claim 2 wherein the levelassignment algorithm assigns each pin of the design to a level of aplurality of levels according to inputs associated with the pin.
 4. Theramptime evaluation tool of claim 3 wherein ramptimes for pins assignedto a particular level are calculated in parallel.
 5. The ramptimeevaluation tool of claim 1 wherein the ramptime evaluation tool isadapted to integrate the ramptime calculations from the localized cycledparts of the design into the level assignment algorithm.